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Thermal Imaging

 

EL System

OptoTherm developed the EL system specifically for use in the electronics industry. With taking 30 frames per second, EL obtains temperature at 19,200 individual points on each image, and can detect temperature changes as small as 0.1°C. EL is capable of identifying small but significant temperature variations of individual components, legs, and even traces.

  • Quickly locate PCBA shorts and other defects
  • Identify latent defects
  • 0.1°C temperature resolution
  • Better than 100 um pixel resolution

 

 

Micro System

Micro was designed for thermal analysis on objects and features with micron size dimensions. The stable Micro platform provides standard threaded mounting holes for fixing custom equipment.

  • Semiconductor die thermal analysis
  • Fiber optic thermal analysis
  • 20 um pixel resolution
  • 0.2°C temperature resolution
  • Pixel emissivity correction technology
  • Quick startup - less than 1 minute

 

Thermal Fixtures

 

 

Heating and Cooling Stages

  • Chamber size from 0.8" x 0.8" to 5.5" x 5.8"
  • Control temperature range: -190°C to 700°C
  • Suitable in normal type and invert type microscope

 

 

 

Hot and Cold Chucks

  • Chuck diameter from 20mm to 600mm
  • Control temperature range from -190°C to 600°C
  • +/- 0.1°C stability
  • Suitable in wafer, chips testing

 

 

Hot and Cold Plates

  • Standard size from 20mm to 300mm
  • Control temperature range from -190°C to 600°C
  • Gas tight covers for defrosting or gas purging
  • Rapid Thermal Annealing
  • Wafer, LCD and FPD testing instrument

 

Bona Fide Instruments
213-215, Photonics Center, HKSP
Shatin, Hong Kong
Email: contact@bonafide.com.hk
Tel:(852) 2345 2355 Fax: (852) 2345 2377